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Author:Pushpanjali Sajjanshetti

Publications
Automated Fabric Defect Detection
Pushpanjali Sajjanshetti, Chaitanya Patil, Marshal Naik, Ganesh Waghmare and Sudarshan Gaikwad
EasyChair Preprint 12723

Keyphrases

Classification, Convolutional Neural Network, Identification of Fabric Defect, image processing, machine learning, Textile Industry.

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